Tuesday, 24 May 2011

Using X-ray to crack the case of the counterfeit components

ChipCheck came across an interesting article just published in the online EMTWorldWide magazine. Titled as above, the article details on the use of a strategy combining visual and X-ray inspection for detection of counterfeit parts. More info can be seen here.
This article has also been published in the May/June 2011 edition of the magazine Global SMT & Packaging South East Asia. For a PDF of the whole magazine, including the counterfeit component article click here.

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