Using X-ray systems to detect countefeit and reworked electronic components

Hot on the heals of the previous article about the use of X-ray inspection for counterfeit component detection, ChipCheck has found a very interesting 6 page read. Titled as above, the paper provides knowledge about techniques using x-ray photography acquisition to speed the detection and accuracy of inspecting counterfeit components.
Originally published in the SMTA International Conference Proceedings, you would have had to purchase the proceedings unless you were an SMTA member. However, the updated version is available free from here!